Trap Level Spectroscopy in Amorphous Semiconductors
Victor V. Mikla, Victor I Mikla
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscopic techniquesDiscusses the advantages and disadvantages of each technique
Thể loại:
Năm:
2010
In lần thứ:
1
Nhà xuát bản:
Elsevier
Ngôn ngữ:
english
Trang:
128
ISBN 10:
0123847168
ISBN 13:
9780123847164
File:
PDF, 1.48 MB
IPFS:
,
english, 2010